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1

Control of Epitaxial Growth of SiGe

van Roijen, Raymond, Steigerwalt, Michael, Bell, Josh D., Harley, Eric, Herbert, Alyssa, Fayaz, Mohammed Fazil, Brodfuehrer, Michael, Mocuta, Anda, Snavely, Colleen

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2015

Language:

english

File:

PDF, 974 KB

english, 2015

2

[IEEE 2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY, USA (2016.5.16-2016.5.19)] 2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Optimizing Wet Clean operations in an established manufacturing environment

Van Roijen, Raymond, Hilscher, David F., Meagher, Colleen, Rettmann, Ryan, McKindles, Derek

Year:

2016

Language:

english

File:

PDF, 855 KB

english, 2016

3

Core Discrete Event Simulation Model for the Evaluation of Health Care Technologies in Major Depressive Disorder

Vataire, Anne-Lise, Aballéa, Samuel, Antonanzas, Fernando, Roijen, Leona Hakkaart-van, Lam, Raymond W., McCrone, Paul, Persson, Ulf, Toumi, Mondher

Journal:

Value in Health

Year:

2014

Language:

english

File:

PDF, 922 KB

english, 2014

4

Defect Reduction by Nitrogen Purge of Wafer Carriers

van Roijen, Raymond, Joshi, Pratik, Ayala, Javier, Bailey, Dane, Conti, Susan G., Brennan, William, Findeis, Paul, Steigerwalt, Michael

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2014

Language:

english

File:

PDF, 1.00 MB

english, 2014

5

Damage caused by Cl2 based dry etching of III–V materials

Raymond van Roijen, CWT Bulle-Lieuwma

Journal:

Year:

1993

Language:

english

File:

PDF, 101 KB

english, 1993

6

InP-based integrated optical components

Raymond Van Roijen, Bart H. Verbeek

Journal:

Philips Journal of Research

Year:

1995

Language:

english

File:

PDF, 1012 KB

english, 1995

7

Fabrication of low-loss integrated optical corner mirrors

van Roijen, Raymond, van der Hofstad, Geert L. A., Groten, Maurice, van der Heyden, John M. M., Thijs, Peter J. A., Verbeek, Bart H.

Journal:

Year:

1993

Language:

english

File:

PDF, 736 KB

english, 1993

8

[IEEE 2014 25th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY (2014.5.19-2014.5.21)] 25th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC 2014) - First time right deposition of embedded SiGe in new products

van Roijen, Raymond, Linskey, Meghan, Harley, Eric, Herbert, Alyssa, Fayaz, Mohammed, Brodfuehrer, Michael, Mocuta, Anda, Steigerwalt, Michael, Snavely, Colleen

Year:

2014

Language:

english

File:

PDF, 146 KB

english, 2014

9

[IEEE 2014 25th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY (2014.5.19-2014.5.21)] 25th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC 2014) - Using in-line film measurement as a proxy for device matching to speed up process change qualification

Chienfan Yu,, Van Roijen, Raymond, Shah, Shailesh, Woodard, Eric, Ayala, Javier, Sziklas, Edward

Year:

2014

Language:

english

File:

PDF, 307 KB

english, 2014

10

Reducing Environmentally Induced Defects While Maintaining Productivity

van Roijen, Raymond, Conti, Susan G., Keyser, Rebekah, Arndt, Russel, Burda, Richard, Ayala, Javier, Henry, Richard O., Levy, Jonathan, Maxson, Jeffrey, Meyette, Eric, Steer, Warwick, Tabakman, Keith,

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2013

Language:

english

File:

PDF, 8.63 MB

english, 2013

11

[IEEE 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY, USA (2015.5.3-2015.5.6)] 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Improving reliability through nitrogen purge of carriers

van Roijen, Raymond, Amanda, Aurelia, Ayala, Javier, Morgenfeld, Laura, La Rosa, Giuseppe

Year:

2015

Language:

english

File:

PDF, 305 KB

english, 2015

12

SPIE Proceedings [SPIE Photonics West '96 - San Jose, CA (Saturday 27 January 1996)] Physics and Simulation of Optoelectronic Devices IV - Monolithic passively mode-locked semiconductor lasers: theory and experiment

van Roijen, Raymond, Koumans, Roger M. P., Verbeek, Bart H., Chow, Weng W., Osinski, Marek

Year:

1996

Language:

english

File:

PDF, 815 KB

english, 1996

13

[IEEE 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY, USA (2017.5.15-2017.5.18)] 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Datamining for yield

Roijen, Raymond Van, Maxson, Jeffery B., Brodfuehrer, Michael, Dyer, Bruce, Meagher, Colleen, Dai, Min, Ayala, Javier, Barthold, Gasner, Steigerwalt, Michael, Wang, Lingjie, McCarthy, David, Rust, Tre

Year:

2017

Language:

english

File:

PDF, 1.07 MB

english, 2017

14

[IEEE 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY, USA (2019.5.6-2019.5.9)] 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Defects caused by Sources other than Processing

Van Roijen, Raymond, Rhoads, Bryan, Friedman, Anne, Suwarno-Handayana, Aurelia, Ayala, Javier, Kwon, Oh-jung, Carbonell, Michael

Year:

2019

Language:

english

File:

PDF, 1.27 MB

english, 2019

15

[IEEE 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY, USA (2020.8.24-2020.8.26)] 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Uniformity and Yield Optimization for a highly diverse Product Mix : Topic: YE

Roijen, Raymond Van, Lucksinger, Mark, Fields, Matthew, Baiocco, Robert, Oh, Min S., Stoll, Derek

Year:

2020

File:

PDF, 225 KB

2020